常溫超級(jí)鉆石刀有兩種角度（35º和45º）可以選擇，鉆石刀的長(zhǎng)度1.5mm-4mm，使用此款鉆石刀可以得到樣品的適宜厚度范圍在30-150nm。以下圖片僅供參考。 
1. 常溫超級(jí)鉆石刀45º 可以勝任一般常規(guī)的切片工作，在切片質(zhì)量和使用壽命兩方面都有很好的表現(xiàn)。對(duì)于極硬的材料和易碎的材料（例如陶瓷），推薦使用此款鉆石刀。 2. 常溫超級(jí)鉆石刀35º 關(guān)于常溫超級(jí)鉆石刀的詳細(xì)特性，可以參考J.JESIOR的相關(guān)著作，在其作品中詳細(xì)描述了利用35º刀怎樣得到更好的切片。 一直以來(lái)，大量的科學(xué)家認(rèn)識(shí)到35º刀在Lowicryle（一般指K4M等包埋劑包埋的樣品）、脫鈣骨、牙齒等等材料的切片中發(fā)揮出色。 大量的實(shí)驗(yàn)證明，35º刀在軟的工業(yè)樣品（例如金屬和聚酯類）的切片中發(fā)揮的與硬的易碎樣品的切片一樣出色，例如半導(dǎo)體材料（Si，GaAs等），超導(dǎo)氧化物，納米晶體陶瓷等等材料。 
Rat muscle （Quadriceps） x 23’000
Werner Graber, Anatomisches Institut, Bern. 產(chǎn)品選購(gòu)： 貨號(hào) | 產(chǎn)品名稱 | 角度 | 長(zhǎng)度 | 15-UL | Ultra Diamond Knife 常溫超級(jí)鉆石刀 | 35° | 1.5mm | 18-UL | Ultra Diamond Knife 常溫超級(jí)鉆石刀 | 35° | 1.8mm | 21-UL | Ultra Diamond Knife 常溫超級(jí)鉆石刀 | 35° | 2.1mm | 24-UL | Ultra Diamond Knife 常溫超級(jí)鉆石刀 | 35° | 2.4mm | 27-UL | Ultra Diamond Knife 常溫超級(jí)鉆石刀 | 35° | 2.7mm | 30-UL | Ultra Diamond Knife 常溫超級(jí)鉆石刀 | 35° | 3.0mm | 35-UL | Ultra Diamond Knife 常溫超級(jí)鉆石刀 | 35° | 3.5mm | 40-UL | Ultra Diamond Knife 常溫超級(jí)鉆石刀 | 35° | 4.0mm | 15-US | Ultra Diamond Knife 常溫超級(jí)鉆石刀 | 45° | 1.5mm | 18-US | Ultra Diamond Knife 常溫超級(jí)鉆石刀 | 45° | 1.8mm | 21-US | Ultra Diamond Knife 常溫超級(jí)鉆石刀 | 45° | 2.1mm | 24-US | Ultra Diamond Knife 常溫超級(jí)鉆石刀 | 45° | 2.4mm | 27-US | Ultra Diamond Knife 常溫超級(jí)鉆石刀 | 45° | 2.7mm | 30-US | Ultra Diamond Knife 常溫超級(jí)鉆石刀 | 45° | 3.0mm | 35-US | Ultra Diamond Knife 常溫超級(jí)鉆石刀 | 45° | 3.5mm | 40-US | Ultra Diamond Knife 常溫超級(jí)鉆石刀 | 45° | 4.0mm |
參考文獻(xiàn)： J.C. Jésior: Use of low-angle diamond knives leads to improved ultrastructural preservation of ultrathin sections. Scanning Microscopy Supplement 3, pp. 17-153, 1989. Scanning Microscopy International,
Chicago （AMF O’Hare） IL 6066 USA. L. Edelmann: Freeze-substitution and the preservation of diffusable ions. Journal of Microscopy, Vol. 161, pp. 217-228, 1991. G. Mahon and T. Malis: Ultramicrotomy of Nano-crystalline Materials. Microscopy Research and Technique, Vol. 31, pp. 267-274, 1995. S.R. Glanvill: Ultramicrotomy of Semiconductors and Related Materials. Microscopy Research and Technique, Vol. 31, pages 267-274, 1995. P. Swab abd R.E. Klinger: Preparation of multilayer coatings for cross-sectional Microanalysis by Ultramicrotomy. Mat. Res. Soc. Symp. Proc. Vol. 115, pages 229-234, 1989. P. Swab: Ultra-microscopy of Diamond Films for TEM Cross-Section Analysis. Microscopy Research and Technique, Vol. 31, pp. 308-310, 1995. C. Quintana: Ultramicrotomy for Cross-sections of Nanostructure. Micron Vol. 28, No. 3, pages 217-219, 1997. Y. Maniette: Microtomy, a convenient method for preparing TEM samples in ceramic science. Journal of Material Science Letters 9, pages 48-50, 1990. P. Schubert-Bischoff and T. Krist: Fast cross-sectioning technique for thin films by Ultramicrotomy. Microscopy and Microanalysis, proceedings, page 359, 1997. J.L. Guerquin-Kern, T.D. Wu, C. Quintana, A. Croisy: Progress in analytical imaging of the cell by dynamic secondary ion mass spectroscopy （SIMS microscopy）. BBA 1724, pp. 228-238, 2005. | 
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